From the 29th of September to the 3rd of October, our colleague Sarah Zerouali will be attending this year’s edition of The RADiation and its Effects […]

ESREF 2025 (European Symposium on Reliability of Electron Devices, Failure Physics and Analysis) will be taking place from October 6-9 in UNESCO’s appointed city of Art […]

𝗪𝗲 𝗮𝗿𝗲 𝗱𝗲𝗲𝗽𝗹𝘆 𝘀𝗮𝗱𝗱𝗲𝗻𝗲𝗱 𝗯𝘆 𝘁𝗵𝗲 𝗽𝗮𝘀𝘀𝗶𝗻𝗴 𝗼𝗳 𝗘𝗺𝗲𝗿𝗶𝘁𝘂𝘀 𝗣𝗿𝗼𝗳𝗲𝘀𝘀𝗼𝗿 𝗞𝗲𝗲𝘀 𝗕𝗲𝗲𝗻𝗮𝗸𝗸𝗲𝗿. Kees was not only a brilliant scientist — he was also a co-founder of […]

At IPFA 2023, Nanyang Technological University presented “Hardware Security Assessment through Repair of Damaged Device,” demonstrating how dies from a damaged SD card, when decapsulated using […]

Over 50% of medical devices contain electronic components, the working of these components are vital in patient care, diagnosis, and treatment. The integration of semiconductors in […]

Our Microwave-Induced Plasma (MIP) machines don’t require specialized lab facilities, making them more cost-effective than acid decapsulation.   Discover all the benefits of MIP technology by downloading […]

From the 5th – 8th of August, our colleagues Yashan Peng and Mark McKinnon were present at 2025’s edition of IPFA in Penang, Malaysia!  Yashan Peng […]

On August 6th in Shangai, China, Kees Beenakker had the honour of holding a plenary talk at ICEPT 2025.   In his plenary talk Prof. Beenakker […]

Removing underfill in your devices, whether they are 2.5D/3D advanced packages, flipchips etc, enables further analysis on your samples, but can be quite challenging using traditional […]