New publication – MIP decapsulation enabling failure analysis of IGBT modules
22 September 2022
JIACO Instruments at Defense Manufacturing Conference (DMC) 2022, December 5 – 8, Tampa, Florida
14 November 2022
Visit JIACO Instruments to discuss artifact-free MIP decapsulation
Traditionally, we are joining as one of the exhibitors at this year’s edition of International Symposium for Testing and Failure Analysis (ISTFA), which will be held in Pasadena from October 30 until November 3. Our team will be ready to welcome you at the boot 521. Whether you’re already a user of our MIP technology, or would like to become one – find us to discuss how we can support you in meeting challenging decapsulation requirements. More details are available via link.
In addition, do not miss to join our demonstration in the expo hall of Pasadena Convention Center during Tools of the Trade from 5:20 pm on Monday, October 31.
Contact us at info@jiaco-instruments.com if you would like to know more about our MIP decapsulation system beforehand, and/or would like to meet with us separately (before, during or after ISTFA).
