Visit us at booth #13 in the exhibition hall

The 34^th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, will take place at Diagora Congress Center in Toulouse (France) from October 2^nd to 5^th, 2023.

This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

JIACO Instruments will be participate in the exhibition, make sure to stop by booth #13 during the exhibition periods. Our team will be glad to introduce our artifact-free Microwave Induced Plasma (MIP) decapsulation technology and advise on how its application range can meet your requirements in physical failure analysis.

Contact us at info@jiaco-instruments.com if you would like to know more beforehand and/or would like to meet with us separately (before, during or after ESTFA-AEC)

Registration for ESTFA+AEC Conference is open. Register here.