Following its tradition, the CAM-Workshop will bring together experts from the electronics industry and from material diagnostics equipment manufacturers in order to discuss challenges, novel solutions and future needs in failure analysis and material characterization of electronic devices, sensors and systems.
This year marks 10th anniversary of CAM-Workshop, where JIACO Instruments will participate as one of the exhibitors. Make sure to stop by our booth (#10) on 25th or 26th April. Our team will be glad to introduce our artifact-free Microwave Induced Plasma (MIP) decapsulation technology and advise on how its application range can meet your requirements in physical failure analysis.
Contact us at firstname.lastname@example.org if you would like to know more beforehand and/or would like to meet with us separately (before, during or after CAM-Workshop).
Registration for CAM-Workshop is open until 14th April. Read more about this event via link: https://www.cam-workshop.de/
(Photo source: https://www.cam-workshop.de)