Contact us at firstname.lastname@example.org if you want to know more beforehand and/or would like to meet with us separately (before, during or after IPFA)
Details about the presentation of our paper:
Wednesday, July 5, 2017
Sample Preparation, Metrology and Defect Characterization I:
Unique Failure Analysis Capabilities Enabled by the MIP Decapsulation Technique
Jiaqi Tang and Jing Wang- JIACO Instruments B.V.
Wang, C. Liu – Huawei Technologies Co., Ltd.
Prof. Dr. Kees Beenakker – Delft University of Technology