JIACO Instruments at ISTFA conference 2015, 1-5 November, Portland

• Booth 527: See our machine, discuss potential
• Session Sample Preparation and Device Deprocessing II’ (Thursday): Presenting latest research on BOAC device.
• Session ‘Sample Prep User Group’ (Thursday): Panel discussion and application case studies of MIP-O2.

Contact us at info@jiaco-instruments.com if you want to know more beforehand and/or would like to meet with us separately (before, during or after ISTFA).

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Details about the presentation of our paper:

Thursday, November 5, 2015

At 1:25 PM

Session Sample Preparation and Device Deprocessing II’

Meeting Room D137 & 138 (Oregon Convention Center )

Decapsulation of Multi-Chip BOAC Devices with Exposed Copper Metallization Using Atmospheric Pressure Microwave Induced Plasma

Jiaqi Tang – JIACO Instruments B.V.

Kristopher D. Staller – Texas Instruments

Kees Beenakker – Delft University of Technology