JIACO Instruments Microwave Induced Plasma (MIP) technology extends Failure Analysis  where traditional decapsulation methods cannot.

Traditional decapsulation methods, such as acid decapsulation, often damage your sample and failure sites during the process itself. This prevents engineers finding the root-cause of a failure and can even lead to destruction of  samples from the process itself.

MIP decapsulation, with it’s high selectivity, preserves the original failure site and your sample and it does not introduce any artifacts from the decapsulation process itself.  Allowing you to find the true root cause 1st time right.

𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗮𝗹𝗹 𝘁𝗵𝗲 𝗯𝗲𝗻𝗲𝗳𝗶𝘁𝘀 𝗼𝗳 𝗠𝗜𝗣 𝘁𝗲𝗰𝗵𝗻𝗼𝗹𝗼𝗴𝘆 𝗯𝘆 𝗱𝗼𝘄𝗻𝗹𝗼𝗮𝗱𝗶𝗻𝗴 𝗼𝘂𝗿 𝘄𝗵𝗶𝘁𝗲𝗽𝗮𝗽𝗲𝗿: click here!