Radiation testing of semiconductors is crucial for devices used in environments with high radiation exposure, such as space or nuclear facilities. Understanding how radiation impacts your product is essential for reliability and performance.

Decapsulation is necessary in radiation effects studies for semiconductors to expose the active die and allow for detailed testing & analysis of the radiation’s effects to the device. This is crucial for understanding how radiation alters the semiconductor’s electrical properties and to validate simulation models 

The real challenge? 
Exposing the die without introducing any damage from the decapsulation process itself. 

Our MIP atmospheric plasma system enables damage-free decapsulation with high selectivity, ensuring your devices are decapsulated 1^st time right so you can accurately simulate the radiation damage devices may see when in space. 

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